CVE-2024-45573
Memory corruption may occour while generating test pattern due to negative indexing of display ID.
More information : https://docs.qualcomm.com/product/publicresources/securitybulletin/february-2025-bulletin.html
Memory corruption may occour while generating test pattern due to negative indexing of display ID.
More information : https://docs.qualcomm.com/product/publicresources/securitybulletin/february-2025-bulletin.html